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In-circuit fault injector user's guideA fault injector system, called an in-circuit injector, was designed and developed to facilitate fault injection experiments performed at NASA-Langley's Avionics Integration Research Lab (AIRLAB). The in-circuit fault injector (ICFI) allows fault injections to be performed on electronic systems without special test features, e.g., sockets. The system supports stuck-at-zero, stuck-at-one, and transient fault models. The ICFI system is interfaced to a VAX-11/750 minicomputer. An interface program has been developed in the VAX. The computer code required to access the interface program is presented. Also presented is the connection procedure to be followed to connect the ICFI system to a circuit under test and the ICFI front panel controls which allow manual control of fault injections.
Document ID
19870018477
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Padilla, Peter A.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 5, 2013
Publication Date
June 1, 1987
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-TM-100478
NAS 1.15:100478
Report Number: NASA-TM-100478
Report Number: NAS 1.15:100478
Accession Number
87N27910
Funding Number(s)
PROJECT: RTOP 505-66-21-07
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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