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Single event upset immune integrated circuits for Project GalileoTests showed that bipolar chips in the attitude control computer of the Galileo spacecraft would likely cause catastrophic mission failure due to single particle upset. This paper describes the design and testing of CMOS replacements which are speed compatible with the bipolar parts and are immune to upset by 165-MeV krypton ions.
Document ID
19870030712
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Giddings, A. E. (Sandia National Labs. Albuquerque, NM, United States)
Hewlett, F. W. (Sandia National Labs. Albuquerque, NM, United States)
Treece, R. K. (Sandia National Laboratories Albuquerque, NM, United States)
Nichols, D. K. (Sandia National Labs. Albuquerque, NM, United States)
Smith, L. S. (Sandia National Labs. Albuquerque, NM, United States)
Zoutendyk, J. A. (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
December 1, 1985
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: NS-32
ISSN: 0018-9499
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
ISSN: 0018-9499
Accession Number
87A17986
Distribution Limits
Public
Copyright
Other

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