NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Microscopic defect structures and equivalent electron fluence conceptsThe lack of additivity of proton and electron exposure of GaAs solar cells has been established as due to macroscopic variations in defect densities. The difference in annealing in proton and electron exposure is herein related to the microscopic variation in defect structures. Electron equivalence can be established when annealing is present only for high energy electrons.
Document ID
19870032721
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Stith, John J.
(NASA Langley Research Center Hampton, VA, United States)
Wilson, John W.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1985
Subject Category
Energy Production And Conversion
Accession Number
87A19995
Funding Number(s)
CONTRACT_GRANT: NSG-1416
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available