Microscopic defect structures and equivalent electron fluence conceptsThe lack of additivity of proton and electron exposure of GaAs solar cells has been established as due to macroscopic variations in defect densities. The difference in annealing in proton and electron exposure is herein related to the microscopic variation in defect structures. Electron equivalence can be established when annealing is present only for high energy electrons.
Document ID
19870032721
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Stith, John J. (NASA Langley Research Center Hampton, VA, United States)
Wilson, John W. (NASA Langley Research Center Hampton, VA, United States)