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Scattering from mirrors contaminated by particulates - A modelA model has been used to fit the bidirectional reflectance distribution function for a variety of samples with different angles of incidence and degrees of contamination and roughness by the proper adjustment of six parameters. Exponential and Gaussian composite surface height autocorrelation functions are used to simulate the data at the small and medium angles, and a perturbation of these functions with two additional parameters allows the fit of the upward and downward curve portions of the data at the large angles. Good agreement is found with previous results. The present approach is the same as the classical dispersion equation in treating the index of refraction of optical materials.
Document ID
19870038665
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Wang, Yaujen
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
December 1, 1986
Publication Information
Publication: Applied Optics
Volume: 25
ISSN: 0003-6935
Subject Category
Optics
Report/Patent Number
ISSN: 0003-6935
Accession Number
87A25939
Distribution Limits
Public
Copyright
Other

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