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Microwave performance of InAlAs/InGaAs/InP MODFET'sModulation-doped InAlAs/InGaAs/InP structures were grown by molecular beam epitaxy and fabricated into FETs with excellent RF gain performance. The intrinsic transconductance was about 400 mS/mm at 300 K. Current gain cutoff frequencies of up to 26.5 GHz were obtained in 1-micron gate devices. Extremely small S12 and large S21 led to a very large F(max) of 62 GHz. These results represent the best reported figures for 1-micron devices in this material system, and slightly better than those obtained in recently developed pseudomorphic modulation-doped field effect transistors.
Document ID
19870040931
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Peng, C. K.
(Illinois Univ. Urbana, IL, United States)
Aksun, M. I.
(Illinois Univ. Urbana, IL, United States)
Ketterson, A. A.
(Illinois Univ. Urbana, IL, United States)
Morkoc, Hadis
(Illinois, University Urbana, United States)
Gleason, K. R.
(Cascade Microtech, Inc. Beaverton, OR, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Publication Information
Publication: IEEE Electron Device Letters
Volume: EDL-8
ISSN: 0741-3106
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
ISSN: 0741-3106
Accession Number
87A28205
Distribution Limits
Public
Copyright
Other

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