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Computer controlled facility for measurement of the bidirectional scattering distribution functionA computer controlled facility for measurement of the bidirectional scattering distribution function is described, with application to the evaluation of spacecraft surface contamination in optical and thermal control systems. An automatic detector/sampleholder allows a 360-deg detector scan around the sample for a complete bidirectional reflectance and transmittance distribution function characterization. The system demonstrates reduced data acquisition and reduction cycle time, and improved accuracy.
Document ID
19870041342
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Carosso, Paolo A. (TS Infosystems Lanham, MD, United States)
Carosso, Nancy J. Pugel (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Publication Information
Publication: Applied Optics
Volume: 26
ISSN: 0003-6935
Subject Category
Instrumentation And Photography
Report/Patent Number
ISSN: 0003-6935
Accession Number
87A28616
Distribution Limits
Public
Copyright
Other

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