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Imaging Of Directional-Solidification InterfacesX-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.
Document ID
19880000091
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Fripp, Archibald L., Jr. (NASA Langley Research Center, Hampton, Va.)
Debnam, William J., Jr. (NASA Langley Research Center, Hampton, Va.)
Berry, Robert F. (NASA Langley Research Center, Hampton, Va.)
Crouch, Roger K. (NASA Headquarters)
Barber, Patrick G. (Longwood College)
Simchick, Richard (PRC Kentron, Inc.)
Date Acquired
August 13, 2013
Publication Date
February 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 2
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-13597
ISSN: 0145-319X
Report Number: LAR-13597
Accession Number
88B10091
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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