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New Mode For Single-Event UpsetsReport presents theory and experimental data regarding newly discovered mode for single-event upsets, (SEU's) in complementary metal-oxide/semiconductor, static random-access memories, CMOS SRAM's. SEU cross sections larger than those expected from previously known modes given rise to speculation regarding additional mode, and subsequent cross-section measurements appear to confirm speculation.
Document ID
19880000564
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Zoutendyk, John A. (Caltech)
Smith, Lawrence S. (Caltech)
Soli, George A. (Caltech)
Lo, Roger Y. (Intel Corp.)
Date Acquired
August 13, 2013
Publication Date
December 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 11
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-17266
Report Number: NPO-17266
ISSN: 0145-319X
Accession Number
88B10564
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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