Exact image method for Gaussian beam problems involving a planar interface

Exact image method, recently introduced for the solution of electromagnetic field problems involving sources above a planar interface or two homogeneous media, is shown to be valid also for sources located in complex space, which makes its application possible for Gaussian beam analysis. It is demonstrated that the Goos-Hanchen shift and the angular shift of a TE polarized beam are correctly given as asymptotic results by the exact reflection image theory. Also, the apparent image location giving the correct Gaussian beam transmitted through the interface is obtained as another asymptotic check. The present theory makes it possible to calculate the exact coupling from the Gaussian beam to the reflected and refracted beams, as well as to the surface wave.