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Noncontact temperature pattern measuring deviceThis invention relates to a noncontact imagine pyrometer system for obtaining the true temperature image of a given substance in a contactless fashion without making assumptions about localized emissivity of the substance or the uniformity of the temperature distribution. Such a contactless temperature imaging system has particular application in the study and production of many materials where the physical contact required to make a conventional temperature measurement drastically effects or contaminates the physical process being observed. Two examples where accurate temperature profiles are of critical interest are: (1) the solid-liquid phase change interface in the production of electronic materials and (2) metastable materials in the undercooling region. The apparent novelty resides in the recognition that an active pyrometer system may be advantageously adapted to perform contactless temperature imaging so that an accurate temperature profile can be obtained.
Document ID
19880015559
Acquisition Source
Legacy CDMS
Document Type
Other - Patent Application
Authors
Elleman, D. D.
(Jet Propulsion Lab. California Inst. of Tech., Pasadena., United States)
Allen, J. L.
(Jet Propulsion Lab. California Inst. of Tech., Pasadena., United States)
Lee, M. C.
(Jet Propulsion Lab. California Inst. of Tech., Pasadena., United States)
Date Acquired
September 5, 2013
Publication Date
November 12, 1987
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.71:NPO-17024-1-CU
Patent Number: NASA-CASE-NPO-17024-1-CU
Patent Application Number: US-PATENT-APPL-SN-159613
Report Number: NAS 1.71:NPO-17024-1-CU
Accession Number
88N24943
Funding Number(s)
CONTRACT_GRANT: NAS7-918
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-17024-1-CU
Patent Application
US-PATENT-APPL-SN-159613
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