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Liquid thickness gaugeA method and apparatus are developed to measure the thickness of a liquid on a surface independent of liquid conductivity. Two pairs of round, corrosion resistant wires are mounted in an insulating material such that the cross-sectional area of each wire is flush with and normal to the surface. The resistance between each pair of wires is measured using two ac resistance measuring circuits, in which the ratio of the outputs of the two resistance measuring circuits is indicative of the thickness of the liquid on the surface.
Document ID
19880019766
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Weinstein, Leonard M. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 13, 2013
Publication Date
August 23, 1988
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-102705
Patent Application Number: US-PATENT-APPL-SN-890982
Patent Number: US-PATENT-4,765,187
Patent Number: NASA-CASE-LAR-13826-1
Patent Application Number: US-PATENT-APPL-SN-684186
Accession Number
88N29150
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,765,187|NASA-CASE-LAR-13826-1
Patent Application
US-PATENT-APPL-SN-102705|US-PATENT-APPL-SN-890982|US-PATENT-APPL-SN-684186

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