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Diffraction imaging (topography) with monochromatic synchrotron radiationStructural information of special interest to crystal growers and device physicists is now available from high resolution monochromatic synchrotron diffraction imaging (topography). In the review, the importance of superior resolution in momentum transfer and in space is described, and illustrations are taken from a variety of crystals: gallium arsenide, cadmium telluride, mercuric iodide, bismuth silicon oxide, and lithium niobate. The identification and understanding of local variations in crystal growth processes are shown. Finally, new experimental opportunities now available for exploitation are indicated.
Document ID
19880021047
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Steiner, Bruce
(National Bureau of Standards Gaithersburg, MD, United States)
Kuriyama, Masao
(National Bureau of Standards Gaithersburg, MD, United States)
Dobbyn, Ronald C.
(National Bureau of Standards Gaithersburg, MD, United States)
Laor, Uri
(National Bureau of Standards Gaithersburg, MD, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1988
Subject Category
Solid-State Physics
Report/Patent Number
NASA-CR-183264
NAS 1.26:183264
Report Number: NASA-CR-183264
Report Number: NAS 1.26:183264
Accession Number
88N30431
Funding Number(s)
CONTRACT_GRANT: NAGW-976
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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