Optical strain measurement system developmentA laser speckle, differential strain measurement system has been built and tested for future applications in hostile environments. One-dimensional electronic correlation of speckle pattern movement allows a quasi-real time measure of strain. The system has been used successfully to measure uniaxial strain reaching into plastic deformation of a test specimen, at temperatures ranging to 450 C. A resolution of 126 microstrain is given by the photodiode array sensor pitch and the specimen to sensor separation. The strain measurement error is estimated to be +/-18 microstrain +/-3 percent of the strain reading. The upper temperature limit of the gauge is determined by air density perturbations causing decorrelation of the reference and shifted speckle patterns, and may be improved by limiting convective flow in the immediate vicinity of the test specimen.
Document ID
19880065330
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lant, Christian T. (NASA Lewis Research Center Cleveland, OH, United States)
Qaqish, Walid (NASA Lewis Research Center; Sverdrup Technology, Inc. Cleveland, OH, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1988
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: International Conference on Photomechanics and Speckle Metrology