Technique for measuring the dielectric constant of thin materials

A practical technique for measuring the dielectric constant of vegetation leaves and similarly thin materials is presented. A rectangular section of the leaf is placed in the tranverse plane in a rectangular waveguide and the magnitude and phase of the reflection coefficient are measured over the desired frequency band using a vector network analyzer. By treating the leaf as an infinitesimally thin resistive sheet, an explicit expression for its dielectric constant is obtained in terms of the reflection coefficient. Because of the thin-sheet approximation, however, this approach is valid only at frequencies below 1.5 GHz. To extend the technique to higher frequencies, higher order approximations are derived and their accuracies are compared to the exact dielectric-slab solution. For a material whose thickness is 0.5 mm or less, the proposed technique was found to provide accurate values of its dielectric constant up to frequencies of 12 GHz or higher. The technique was used to measure the 8 to 12 GHz dielectric spectrum for vegetation leaves, teflon and rock samples.