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Calculations of critical misfit and thickness: An overviewThis overview stresses the equilibrium/nonequilibrium nature of the physical properties, as well as the basic properties of the models, used to calculate critical misfit and critical thickness in epitaxy.
Document ID
19890006358
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Vandermerwe, Jan H.
(Pretoria Univ.)
Jesser, W. A.
(Pretoria Univ.)
Date Acquired
September 5, 2013
Publication Date
January 1, 1988
Subject Category
Solid-State Physics
Report/Patent Number
NASA-CR-182995
NAS 1.26:182995
Report Number: NASA-CR-182995
Report Number: NAS 1.26:182995
Accession Number
89N15729
Funding Number(s)
CONTRACT_GRANT: NAG1-350
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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