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Analytical and experimental procedures for determining propagation characteristics of millimeter-wave gallium arsenide microstrip linesIn this report, a thorough analytical procedure is developed for evaluating the frequency-dependent loss characteristics and effective permittivity of microstrip lines. The technique is based on the measured reflection coefficient of microstrip resonator pairs. Experimental data, including quality factor Q, effective relative permittivity, and fringing for 50-omega lines on gallium arsenide (GaAs) from 26.5 to 40.0 GHz are presented. The effects of an imperfect open circuit, coupling losses, and loading of the resonant frequency are considered. A cosine-tapered ridge-guide text fixture is described. It was found to be well suited to the device characterization.
Document ID
19890011798
Acquisition Source
Legacy CDMS
Document Type
Technical Publication (TP)
Authors
Romanofsky, Robert R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
March 1, 1989
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-TP-2899
NAS 1.60:2899
E-4273
Report Number: NASA-TP-2899
Report Number: NAS 1.60:2899
Report Number: E-4273
Accession Number
89N21169
Funding Number(s)
PROJECT: RTOP 506-44-2C
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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