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X-ray based extensometryA totally new method of extensometry using an X-ray beam was proposed. The intent of the method is to provide a non-contacting technique that is immune to problems associated with density variations in gaseous environments that plague optical methods. X-rays are virtually unrefractable even by solids. The new method utilizes X-ray induced X-ray fluorescence or X-ray induced optical fluorescence of targets that have melting temperatures of over 3000 F. Many different variations of the basic approaches are possible. In the year completed, preliminary experiments were completed which strongly suggest that the method is feasible. The X-ray induced optical fluorescence method appears to be limited to temperatures below roughly 1600 F because of the overwhelming thermal optical radiation. The X-ray induced X-ray fluorescence scheme appears feasible up to very high temperatures. In this system there will be an unknown tradeoff between frequency response, cost, and accuracy. The exact tradeoff can only be estimated. It appears that for thermomechanical tests with cycle times on the order of minutes a very reasonable system may be feasible. The intended applications involve very high temperatures in both materials testing and monitoring component testing. Gas turbine engines, rocket engines, and hypersonic vehicles (NASP) all involve measurement needs that could partially be met by the proposed technology.
Document ID
19890016061
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Jordan, E. H.
(Connecticut Univ. Storrs, CT, United States)
Pease, D. M.
(Connecticut Univ. Storrs, CT, United States)
Date Acquired
September 6, 2013
Publication Date
December 1, 1988
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-185058
NAS 1.26:185058
Report Number: NASA-CR-185058
Report Number: NAS 1.26:185058
Accession Number
89N25432
Funding Number(s)
CONTRACT_GRANT: NAG3-854
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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