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Dual wavelength holographic interferometry systemThe present invention relates to a two-wave holographic interferometry system and method. In such systems, a reference beam holographic is super-imposed on an object beam, the object beam being an image obtained by passing as beam through an object regarding which some parameter (e.g., temperature gradient) is to be measured. A photograph of the superimposed beams is taken. The present invention employs to object and two reference beams and the invention is particularly concerned with the use of a prism assembly which causes the two different wavelengths of the object beams to emerge from the prism at slightly different angles, thereby providing two holographic images which are slightly displaced from each other.
Document ID
19890016831
Acquisition Source
Marshall Space Flight Center
Document Type
Other - Patent
External Source(s)
MFS-28242-1
Authors
William K Witherow (Marshall Space Flight Center Redstone Arsenal, United States)
Andreas Ecker (European Space Agency Paris, France)
Date Acquired
August 13, 2013
Publication Date
March 7, 1989
Publication Information
Publisher: United States Patent and Trademark Office
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,810,094
Patent Number: NASA-CASE-MFS-28242-1
Patent Application Number: US-PATENT-APPL-SN-149822
Accession Number
89N26202
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,810,094
Patent Application
US-PATENT-APPL-SN-149822

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