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Optical properties of epitaxial CoSi2 and NiSi2 films on siliconThe optical constants of epitaxial films of CoSi2 and NiSi2, grown by molecular beam epitaxy on Si(111), in the energy range of 0.9-4.0 eV have been measured. The behavior of the optical constants is characteristic of metals. It is Drude-like in low energy region and deviates from Drude behavior as interband transitions set in. Interband transitions are found to have already set in at 1 eV. The absorption varies significantly with energy, which has implications for photoresponse studies of internal photoemission in these material systems.
Document ID
19890066145
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Jimenez, J. R.
(Rensselaer Polytechnic Inst. Troy, NY, United States)
Wu, Z.-C.
(Rensselaer Polytechnic Inst. Troy, NY, United States)
Schowalter, L. J.
(Rensselaer Polytechnic Institute, Troy, NY, United States)
Hunt, B. D.
(California Institute of Technology, Jet Propulsion Laboratory, Pasadena; GE Corporate Research and Development Center Schenectady, NY, United States)
Fathauer, R. W.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 14, 2013
Publication Date
September 15, 1989
Publication Information
Publication: Journal of Applied Physics
Volume: 66
ISSN: 0021-8979
Subject Category
Solid-State Physics
Report/Patent Number
ISSN: 0021-8979
Accession Number
89A53516
Distribution Limits
Public
Copyright
Other

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