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Noise-Contamination DetectorDeviations in periods of output from tracking filter measured. Signal-analyzing system measures degree to which sinusoid contaminated by noise. Noise-contamination detector indirectly measures noise in noisy sinusoidal signal by measuring average value of fractional absolute dither in period of signal. Developed to measure noise in outputs of vibration sensors used to test bearings and other components of rotating machinery.
Document ID
19900000149
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Randall, Richard L.
(Rockwell International Corp.)
Date Acquired
August 14, 2013
Publication Date
April 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
MFS-29537
ISSN: 0145-319X
Report Number: MFS-29537
Accession Number
90B10149
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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