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Layered Internal-Photoemission SensorHigh quantum efficiency achieved without multiple layer contacts. Proposed infrared sensor based on photoemission from multiple layers of metal silicide sandwiched between layers of silicon. Suitable for use in focal-plane arrays. Layered internal-photoemission sensor has positive/intrinsic/negative structure modified by inclusion of layers or islands of metal silicide. Holes photo-excited from silicide regions and swept to detection by reverse-bias electric field in intrinsic silicon. Easier to make because internal layers allowed to "float" electrically, contact being made with only two outer semiconductor layers.
Document ID
19900000207
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Fathauer, Robert W.
(Caltech)
Date Acquired
August 14, 2013
Publication Date
May 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 5
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-17751
Report Number: NPO-17751
ISSN: 0145-319X
Accession Number
90B10207
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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