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Failures Of CMOS Devices At Low Radiation-Dose RatesMethod for obtaining approximate failure-versus-dose-rate curves derived from experiments on failures of SGS 4007 complementary metal oxide/semiconductor (CMOS) integrated circuits irradiated by Co60 and Cs137 radioactive sources.
Document ID
19900000565
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Goben, Charles A. (Caltech)
Price, William E. (Caltech)
Date Acquired
August 14, 2013
Publication Date
November 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 11
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-17868
Report Number: NPO-17868
ISSN: 0145-319X
Accession Number
90B10565
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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