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Total hemispherical emittance measured at high temperatures by the calorimetric methodA calorimetric vacuum emissometer (CVE) capable of measuring total hemispherical emittance of surfaces at elevated temperatures was designed, built, and tested. Several materials with a wide range of emittances were measured in the CVE between 773 to 923 K. These results were compared to values calculated from spectral emittance curves measured in a room temperature Hohlraum reflectometer and in an open-air elevated temperature emissometer. The results differed by as much as 0.2 for some materials but were in closer agreement for the more highly-emitting, diffuse-reflecting samples. The differences were attributed to temperature, atmospheric, and directional effects, and errors in the Hohlraum and emissometer measurements (plus or minus 5 percent). The probable error of the CVE measurements was typically less than 1 percent.
Document ID
19900000993
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Difilippo, Frank
(Case Western Reserve Univ. Cleveland, OH., United States)
Mirtich, Michael J.
(Cleveland State Univ. OH., United States)
Banks, Bruce A.
(NASA Lewis Research Center Cleveland, OH, United States)
Stidham, Curtis
(NASA Lewis Research Center Cleveland, OH, United States)
Kussmaul, Michael
(Cleveland State Univ. OH., United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1989
Subject Category
Engineering (General)
Report/Patent Number
E-4704
NAS 1.15:102322
NASA-TM-102322
Meeting Information
Meeting: International Conference on Metallurgical Coatings
Location: San Diego, CA
Country: United States
Start Date: April 17, 1989
End Date: April 21, 1989
Sponsors: American Vacuum Society
Accession Number
90N10309
Funding Number(s)
PROJECT: RTOP 586-01-11
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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