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Linear digital imaging system fidelity analysisThe combined effects of imaging gathering, sampling and reconstruction are analyzed in terms of image fidelity. The analysis is based upon a standard end-to-end linear system model which is sufficiently general so that the results apply to most line-scan and sensor-array imaging systems. Shift-variant sampling effects are accounted for with an expected value analysis based upon the use of a fixed deterministic input scene which is randomly shifted (mathematically) relative to the sampling grid. This random sample-scene phase approach has been used successfully by the author and associates in several previous related papers.
Document ID
19900006889
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Park, Stephen K.
(College of William and Mary Williamsburg, VA, United States)
Date Acquired
September 6, 2013
Publication Date
November 1, 1989
Publication Information
Publication: NASA, Langley Research Center, Visual Information Processing for Television and Telerobotics
Subject Category
Instrumentation And Photography
Accession Number
90N16205
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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