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Development of inspection techniques for quantitatively measuring surface contamination on SRM hardwareA contaminant is any material or substance which is potentially undesirable or which may adversely affect any part, component, or assembly. Contamination control of SRM hardware surfaces is a serious concern, for both Thiokol and NASA, with particular concern for contaminants which may adversely affect bonding surfaces. The purpose of this study is to develop laboratory analytical techniques which will make it possible to certify the cleanliness of any designated surface, with special focus on particulates (dust, dirt, lint, etc.), oils (hydrocarbons, silicones, plasticizers, etc.), and greases (HD-2, fluorocarbon grease, etc.). The hardware surfaces of concern will include D6AC steel, aluminum alloys, anodized aluminum alloys, glass/phenolic, carbon/phenolic, NBR/asbestos-silica, and EPDM rubber.
Document ID
19900010292
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Law, R. D.
(Morton Thiokol Brigham City, UT, United States)
Date Acquired
September 6, 2013
Publication Date
October 13, 1989
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NASA-CR-183902
LSDI-90-08
NAS 1.26:183902
TWR-50087
Report Number: NASA-CR-183902
Report Number: LSDI-90-08
Report Number: NAS 1.26:183902
Report Number: TWR-50087
Accession Number
90N19608
Funding Number(s)
CONTRACT_GRANT: NAS8-30490
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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