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Dual cathode system for electron beam instrumentsAn electron beam source having a single electron optical axis is provided with two coplanar cathodes equally spaced on opposite sides from the electron optical axis. A switch permits selecting either cathode, and a deflection system comprised of electromagnets, each with separate pole pieces equally spaced from the plane of the cathodes and electron optical axis, first deflects the electron beam from a selected cathode toward the electron optical axis, and then in an opposite direction into convergence with the electron optical axis. The result is that the electron beam from one selected cathode undergoes a sigmoid deflection in two opposite directions, like the letter S, with the sigmoid deflection of each being a mirror image of the other.
Document ID
19900011035
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Bradley, James G.
(California Inst. of Tech. Pasadena., United States)
Conley, Joseph M.
(California Inst. of Tech. Pasadena., United States)
Wittry, David B.
(California Inst. of Tech. Pasadena., United States)
Date Acquired
August 14, 2013
Publication Date
July 11, 1989
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,847,502
Patent Number: NASA-CASE-NPO-16878-1-CU
Patent Application Number: US-PATENT-APPL-SN-084062
Accession Number
90N20351
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,847,502|NASA-CASE-NPO-16878-1-CU
Patent Application
US-PATENT-APPL-SN-084062
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