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Multiwavelength pyrometry to correct for reflected radiationComputer curve fitting is used in multiwavelength pyrometry to measure the temperature of a surface in the presence of reflected radiation by decomposing its radiation spectrum. Computer-simulated spectra (at a surface temperature of 1000 K; in the wavelength region 0.3 to 20 microns; with a reflected radiation-source temperature of 700 to 2500 K; and reflector emissivity from 0.1 to 0.9) were generated and decomposed. This method of pyrometry determined the surface temperatures under these conditions to within 5 percent. The practicability of the method was further demonstrated by the successful analysis of a related problem--decomposition of the real spectrum of an infrared source containing two emitters to determine their temperatures.
Document ID
19900014398
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Ng, Daniel L. P.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1990
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.15:102578
E-5409
NASA-TM-102578
Report Number: NAS 1.15:102578
Report Number: E-5409
Report Number: NASA-TM-102578
Accession Number
90N23714
Funding Number(s)
PROJECT: RTOP 510-01-0A
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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