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Progress in high temperature speckle-shift strain measurement systemA fast, easy to use speckle tracking system is under development for the speckle-shift strain measurement technique. Preliminary correlation tests on wire specimens show strong correlations of well-developed speckle patterns. Stable cross-correlations were obtained from a tungsten filament at 2480 C. An analysis of the optical system determines the minimum required sampling frequency of the speckle pattern to be 2.55 pixels per speckle.
Document ID
19900018715
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lant, Christian T. (Sverdrup Technology, Inc., Brook Park OH., United States)
Barranger, John P. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1990
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.15:103255
NASA-TM-103255
E-5684
Report Number: NAS 1.15:103255
Report Number: NASA-TM-103255
Report Number: E-5684
Meeting Information
Meeting: International Conference on Hologram Interferometry and Speckle Metrology
Location: Baltimore, MD
Country: United States
Start Date: November 5, 1990
End Date: November 8, 1990
Sponsors: Society of Experimental Mechanics
Accession Number
90N28031
Funding Number(s)
PROJECT: RTOP 582-01-11
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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