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Anomalies due to single event upsetsThe description of single event upsets (SEUs) in the spacecraft Anomalies Handbook is reviewed. The basic mechanism involved in SEUs is summarized and discussed in terms of circuit analysis. Calculation of SEU rate is analytically described and discussed. Departures from single step function dependence in the SEU rate is addressed.
Document ID
19900032663
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Robinson, P. A., Jr. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lee, W. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Aguero, R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Gabriel, S. B. (JPL Pasadena, CA, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1990
Subject Category
Spacecraft Design, Testing And Performance
Report/Patent Number
AIAA PAPER 90-0174
Report Number: AIAA PAPER 90-0174
Accession Number
90A19718
Distribution Limits
Public
Copyright
Other

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