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Advanced NDE technology for materials characterization
Document ID
19900066351
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Heyman, Joseph S.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 14, 2013
Publication Date
November 1, 1987
Publication Information
Publication: NDE at NASA Langley. Advancing the State-of-the-Art and Providing a Quantitative Science Base for Materials Characterization
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: DoD Manufacturing Technology Advisory Group Test and Inspection Mini-Symposium
Start Date: November 25, 1984
End Date: November 29, 1984
Accession Number
90N70297
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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