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Test Adapter For Infrared DetectorsConvenient fixture for testing infrared detector integrated circuits, such as those used in surveying sensors, optical communications, receivers, optical power meters, and noncontacting thermometers. Includes electrical connections for 42-pin dual-in-line package (DIP), thermal connection to cryogenic probe, and optical filter. Using fixture, electrical and optical properties of detector measured at 4 K.
Document ID
19910000337
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Campbell, Albert G.
(Rockwell International Corp.)
Gable, A. L.
(Rockwell International Corp.)
Date Acquired
August 14, 2013
Publication Date
July 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 7
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
ARC-11389
ISSN: 0145-319X
Report Number: ARC-11389
Accession Number
91B10337
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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