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Contact Probe With Pivoting TipSensor probe follows curved contours, always keeping sensor in contact with contoured surface. Includes freely pivoting tip, which contains sensor. Spring holds tip in contact with surface being scanned. As user moves probe along surface, force of contact keeps tip oriented along local perpendicular to surface. Slopes of up to 90 degrees from axis of probe accommodated.
Document ID
19910000600
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Amos, Jay M.
(United Technologies Corp.)
Raulerson, David A.
(United Technologies Corp.)
Date Acquired
August 14, 2013
Publication Date
November 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 11
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
MFS-28536
Report Number: MFS-28536
ISSN: 0145-319X
Accession Number
91B10600
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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