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Uses of Auger and x ray photoelectron spectroscopy in the study of adhesion and frictionThree studies are described characterizing the possible contributions of surface science to tribology. These include surface contamination formed by the interaction of a surface with the environment, contaminants obtained with diffusion of compounds, and surface chemical changes resulting from selective thermal evaporation. Surface analytical tools such as Auger electron spectroscopy (AES) and x ray photoelectron spectroscopy (XPS) incorporated directly into adhesion and friction systems are primarily used to define the nature of tribological surfaces before and after tribological experimentation and to characterize the mechanism of solid-to-solid interaction. Emphasis is on fundamental studies involving the role of surfaces in controlling the adhesion and friction properties of materials emerging as a result of the surface analyses. The materials which were studied include metals and ceramics such as elemental metals, amorphous alloys (metallic glasses), and silicon-based ceramics.
Document ID
19910002609
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Miyoshi, Kazuhisa
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
August 1, 1990
Subject Category
Nonmetallic Materials
Report/Patent Number
NAS 1.15:103266
E-5631
NASA-TM-103266
Report Number: NAS 1.15:103266
Report Number: E-5631
Report Number: NASA-TM-103266
Meeting Information
Meeting: International Symposium on Industrial Tribology
Location: Chicago, IL
Country: United States
Start Date: August 29, 1990
End Date: August 31, 1990
Sponsors: NSF
Accession Number
91N11922
Funding Number(s)
PROJECT: RTOP 506-43-11
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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