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General method of pattern classification using the two-domain theoryHuman beings judge patterns (such as images) by complex mental processes, some of which may not be known, while computing machines extract features. By representing the human judgements with simple measurements and reducing them and the machine extracted features to a common metric space and fitting them by regression, the judgements of human experts rendered on a sample of patterns may be imposed on a pattern population to provide automatic classification.
Document ID
19910004598
Acquisition Source
Legacy CDMS
Document Type
Other - Patent Application
Authors
Rorvig, Mark E.
(NASA Lyndon B. Johnson Space Center Houston, TX, United States)
Date Acquired
September 6, 2013
Publication Date
September 25, 1990
Subject Category
Computer Programming And Software
Report/Patent Number
NAS 1.71:MSC-21737-1
Patent Application Number: US-PATENT-APPL-SN-587922
Patent Number: NASA-CASE-MSC-21737-1
Report Number: NAS 1.71:MSC-21737-1
Accession Number
91N13911
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-MSC-21737-1
Patent Application
US-PATENT-APPL-SN-587922
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