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Total-dose radiation effects data for semiconductor devices (1989 supplement)Steady state, total dose radiation test data are provided for electronic designers and other personnel using semiconductor devices in a radiation environment. The data are presented in graphic and narrative formats. Two primary radiation source types were used: Cobalt-60 gamma rays and a Dynamitron electron accelerator capable of delivering 2.5 MeV electrons at a steady rate.
Document ID
19910004736
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Martin, Keith E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Coss, James R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Goben, Charles A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Shaw, David C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Farmanesh, Sam
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Davarpanah, Michael M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Craft, Leroy H.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Price, William E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 6, 2013
Publication Date
February 15, 1990
Subject Category
Solid-State Physics
Report/Patent Number
NAS 1.26:187431
JPL-PUBL-89-17
NASA-CR-187431
Report Number: NAS 1.26:187431
Report Number: JPL-PUBL-89-17
Report Number: NASA-CR-187431
Accession Number
91N14049
Funding Number(s)
PROJECT: RTOP 323-51-43-05-00
CONTRACT_GRANT: NAS7-918
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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