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Field induced gap infrared detectorA tunable infrared detector which employs a vanishing band gap semimetal material provided with an induced band gap by a magnetic field to allow intrinsic semiconductor type infrared detection capabilities is disclosed. The semimetal material may thus operate as a semiconductor type detector with a wavelength sensitivity corresponding to the induced band gap in a preferred embodiment of a diode structure. Preferred semimetal materials include Hg(1-x)Cd(x)Te, x is less than 0.15, HgCdSe, BiSb, alpha-Sn, HgMgTe, HgMnTe, HgZnTe, HgMnSe, HgMgSe, and HgZnSe. The magnetic field induces a band gap in the semimetal material proportional to the strength of the magnetic field allowing tunable detection cutoff wavelengths. For an applied magnetic field from 5 to 10 tesla, the wavelength detection cutoff will be in the range of 20 to 50 micrometers for Hg(1-x)Cd(x)Te alloys with x about 0.15. A similar approach may also be employed to generate infrared energy in a desired band gap and then operating the structure in a light emitting diode or semiconductor laser type of configuration.
Document ID
19910005275
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Elliott, C. Thomas
(Jet Propulsion Lab. California Inst. of Tech., Pasadena., United States)
Date Acquired
August 14, 2013
Publication Date
August 28, 1990
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-4,952,811
Patent Application Number: US-PATENT-APPL-SN-369403
Patent Number: NASA-CASE-NPO-17526-1-CU
Accession Number
91N14588
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,952,811|NASA-CASE-NPO-17526-1-CU
Patent Application
US-PATENT-APPL-SN-369403
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