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Investigation of microstructural changes in polyetherether-ketone films at cryogenic temperatures by positron lifetime spectroscopyMicrostructural changes in Polyetherether-ketone (PEEK) films were investigated in the temperature ranges of 23 to -196 C, using Positron Lifetime Spectroscopy (PLS) technique. It was determined that the total free volume decreases by about 46 percent in amorphous PEEK samples and about 36 percent in semicrystalline PEEK samples when they are cooled down from room temperature to liquid nitrogen (LN2) temperature. If this trend in reduction in free volume with decreasing temperature continues, as expected, it is surmised that PEEK will be able to withstand cooling down to liquid hydrogen (LH2) temperature without any detrimental effect on its diffusivity for liquid hydrogen.
Document ID
19910008903
Acquisition Source
Legacy CDMS
Document Type
Technical Publication (TP)
Authors
Singh, Jag J. (NASA Langley Research Center Hampton, VA., United States)
Eftekhari, Abe (Analytical Services and Materials, Inc., Hampton VA., United States)
St.clair, Terry L. (NASA Langley Research Center Hampton, VA., United States)
Sprinkle, Danny R. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1991
Subject Category
Composite Materials
Report/Patent Number
NASA-TP-3064
NAS 1.60:3064
L-16841
Report Number: NASA-TP-3064
Report Number: NAS 1.60:3064
Report Number: L-16841
Accession Number
91N18216
Funding Number(s)
PROJECT: RTOP 506-43-21-05
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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