Digital test signal generation: An accurate SNR calibration approach for the DSN

A new method of generating analog test signals with accurate signal to noise ratios (SNRs) is described. High accuracy will be obtained by simultaneous generation of digital noise and signal spectra at a given baseband or bandpass limited bandwidth. The digital synthesis will provide a test signal embedded in noise with the statistical properties of a stationary random process. Accuracy will only be dependent on test integration time with a limit imposed by the system quantization noise (expected to be 0.02 dB). Setability will be approximately 0.1 dB. The first digital SNR generator to provide baseband test signals is being built and will be available in early 1991.