Electron temperature and concentration in a thermal atomic oxygen source

A thermal atomic oxygen source for materials screening was built for NASA by Boeing Aerospace. The objective here was to use a microwave interferometer and Langmuir probe to characterize the electron concentration in this thermal atomic oxygen source. Typical operating conditions in the thermal atomic oxygen source were found to produce electron concentrations that were well below the detection threshold of the interferometer (10(exp 8) cm (sup -3)). The researchers calibrated (with the interferometer) the Langmuir probe at an artificially high plasma density and then used the circular and the square Langmuir probes to measure the low electron concentrations that exist during materials exposure tests. Electron concentration was measured as a function of power and position. The electrons were lost to the walls through ambipolar diffusion, and their concentration was accurately described by an equation. The electron concentration was proportional to power squared and decayed exponentially with distance.