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The metrology of spherical shells using synchrotron x ray microtomographyWith recent advances in solid state imaging technology and the increasing availability of synchrotron x-ray radiation sources, synchrotron x-ray microtomography is emerging as a nondestructive technique for the evaluation of the structure and composition of small specimens with spatial resolution in the micron range. Synchrotron radiation offers the following advantages over conventional x-ray sources: high brightness, continuous emission which is tunable over a large energy range, faster data collection rates, and a highly collimated beam of large cross section permitting the illumination of large specimens. Synchrotron x-ray microtomography enables the structure of individual spheres to be evaluated in order to reveal the concentricity and sphericity of the internal void and the uniformity of the shell wall in the case of high quality spherical shells for Sandia National Laboratories' Inertial Confinement Fusion project.
Document ID
19910012061
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Hmelo, Anthony B.
(Vanderbilt Univ. Nashville, TN., United States)
Allen, James L.
(Vanderbilt Univ. Nashville, TN., United States)
Damico, Kevin L.
(Exxon Research and Engineering Co. Linden, NJ., United States)
Date Acquired
September 6, 2013
Publication Date
May 1, 1990
Publication Information
Publication: JPL, Proceedings of the First Workshop on Containerless Experimentation in Microgravity
Subject Category
Materials Processing
Accession Number
91N21374
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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