Lightning testing at the subsystem level

Testing at the subsystem or black box level for lightning hardness is required if system hardness is to be assured at the system level. The often applied philosophy of lighting testing only at the system level leads to extensive end of the line design changes which result in excessive costs and time delays. In order to perform testing at the subsystem level two important factors must be defined to make the testing simulation meaningful. The first factor is the definition of the test stimulus appropriate to the subsystem level. Application of system level stimulations to the subsystem level usually leads to significant overdesign of the subsystem which is not necessary and may impair normal subsystem performance. The second factor is the availability of test equipment needed to provide the subsystem level lightning stimulation. Equipment for testing at this level should be portable or at least movable to enable efficient testing in a design laboratory environment. Large fixed test installations for system level tests are not readily available for use by the design engineers at the subsystem level and usually require special operating skills. The two factors, stimulation level and test equipment availability, must be evaluated together in order to produce a practical, workable test standard. The neglect or subordination of either factor will guarantee failure in generating the standard. It is not unusual to hear that test standards or specifications are waived because a specified stimulation level cannot be accomplished by in-house or independent test facilities. Determination of subsystem lightning simulation level requires a knowledge and evaluation of field coupling modes, peak and median levels of voltages and currents, bandwidths, and repetition rates. Practical limitations on test systems may require tradeoffs in lightning stimulation parameters in order to build practical test equipment. Peak power levels that can be generated at specified bandwidths with standard electrical components must be considered in the design and costing of the test system. Stimulation tests equipment and test methods are closely related and must be considered a test system for lightning simulation. A non-perfect specification that can be reliably and repeatedly applied at the subsystem test level is more desirable than a perfect specification that cannot be applied at all.