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Electromigration failure in YBa2Cu3O(7-x) thin filmsElectromigration failure in highly oriented YBa2Cu3O(7-x) thin films below the superconducting transition temperature is reported here for the first time. The film on SrTiO3 failed at 86 K, 230,000 A/sq cm, while that on LaAlO3 failed at 84 K, 930,000 A/sq cm. Scanning electron microscopy and energy dispersive X-ray analysis of the films after failure shows that Cu migrates preferentially away from the failure region toward the electrode.
Document ID
19910042366
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1063/1.104539
Authors
Vitta, Satish (NASA Lewis Research Center Cleveland, OH, United States)
Stan, M. A. (NASA Lewis Research Center Cleveland, OH, United States)
Warner, J. D. (NASA Lewis Research Center Cleveland, OH, United States)
Alterovitz, S. A. (NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 14, 2013
Publication Date
February 18, 1991
Publication Information
Publication: Applied Physics Letters
Volume: 58
ISSN: 0003-6951
Subject Category
Solid-State Physics
Report/Patent Number
ISSN: 0003-6951
Accession Number
91A26989
Distribution Limits
Public
Copyright
Other

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