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Single-Event-Upset Laser Scanner With Optical BiasLight-assisted microelectronic advanced laser scanner (LAMEALS) is augmented version of microelectronic advanced laser scanner (MEALS) described in article, "Laser Scanner Tests For Single-Event Upsets", (NPO-18216). Only major difference, steady illumination from helium/neon laser, argon-ion laser, and/or other source(s) combined with pulsed dye-laser illumination of MEALS into single illuminating beam.
Document ID
19920000073
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Kim, Quiesup (Caltech)
Date Acquired
August 15, 2013
Publication Date
February 1, 1992
Publication Information
Publication: NASA Tech Briefs
Volume: 16
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-18217
ISSN: 0145-319X
Report Number: NPO-18217
Accession Number
92B10073
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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