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Effects on LDEF exposed copper film and bulkTwo forms of copper were exposed to the Long Duration Exposure Facility (LDEF) Mission 1 environment: a copper film, initially 74.2 plus or minus 1.1 nm thick sputter coated on a fused silica flat and a bulk piece of oxygen-free, high conductivity (OFHC) copper. The optical density of the copper film changed from 1.33 to 0.70 where exposed, and the film thickness increased to 106.7 plus or minus 0.5 nm where exposed. The exposed area appears purple by reflection and green by transmission for the thin film and maroon color for the bulk copper piece. The exposed areas increased in thickness, but only increase in the thickness of the thin film sample could be readily measured. The increase in film thickness is consistent with the density changes occurring during conversion of copper to an oxide. However, we have not been able to confirm appreciable conversion to an oxide by x-ray diffraction studies. We have not yet subjected the sample to e-beams or more abusive investigations out of concern that the film might be modified.
Document ID
19920001858
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Peters, Palmer N.
(NASA Marshall Space Flight Center Huntsville, AL., United States)
Gregory, John C.
(Alabama Univ. Huntsville, AL, United States)
Christl, Ligia C.
(Alabama Univ. Huntsville, AL, United States)
Raikar, Ganesh N.
(Alabama Univ. Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
August 31, 1991
Publication Information
Publication: Analysis of Surfaces from the LDEF A0114, Phase 4
Subject Category
Spacecraft Design, Testing And Performance
Accession Number
92N11076
Funding Number(s)
CONTRACT_GRANT: NAGW-812
CONTRACT_GRANT: NAS8-36645
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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