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Ion Collection From a Plasma by a PinholeIon focusing by a biased pinhole is studied numerically. Laplace's equation is solved in 3-D for cylindrical symmetry on a constant grid to determine the potential field produced by a biased pinhole in a dielectric material. Focusing factors are studied for ions of uniform incident velocity with a three dimensional Maxwellian distribution superimposed. Ion currents to the pinhole are found by particle tracking. The focusing factor of positive ions as a function of initial velocity, temperature, injection radius, and hole size is reported. For a typical Space Station Freedom environment (oxygen ions having a 4.5 eV ram energy, 0.1 eV temperature, and a -140 V biased pinhole), a focusing factor of 13.35 is found for a 1.5 mm radius pinhole.
Document ID
19920013125
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
David B Snyder
(Lewis Research Center Cleveland, OH, United States)
Joel L Herr
(Sverdrup Technology, Inc. OH., United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1992
Publication Information
Publication: 5th Annual Workshop on Space Operations Applications and Research (SOAR 1991)
Publisher: National Aeronautics and Space Administration
Volume: 2
Subject Category
Plasma Physics
Report/Patent Number
NASA/CP-3127/Vol II
Meeting Information
Meeting: Space Operation, Application and Research Symposium
Location: Houston, TX
Country: US
Start Date: July 9, 1991
End Date: July 11, 1991
Sponsors: National Aeronautics and Space Administration, U.S. Air Force Phillips Laboratory, University of Houston - Clear Lake
Accession Number
92N22368
Funding Number(s)
CONTRACT_GRANT: NAS3-25266
Distribution Limits
Public
Copyright
Public Use Permitted.
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