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Ion microprobe elemental analyses of impact features on interplanetary dust experiment sensor surfacesHypervelocity impact features from very small particles (less than 3 microns in diameter) on several of the electro-active dust sensors used in the Interplanetary Dust Experiment (IDE) were subjected to elemental analysis using an ion microscope. The same analytical techniques were applied to impact and containment features on a set of ultra-pure, highly polished single crystal germanium wafer witness plates that were mounted on tray B12. Very little unambiguously identifiable impactor debris was found in the central craters or shatter zones of small impacts in this crystalline surface. The surface contamination, ubiquitous on the surface of the Long Duration Exposure Facility, has greatly complicated data collection and interpretation from microparticle impacts on all surfaces.
Document ID
19920014075
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Simon, Charles G.
(Institute for Space Science and Technology, Inc., Gainesville FL., United States)
Hunter, Jerry L.
(North Carolina State Univ. Raleigh., United States)
Wortman, Jim J.
(North Carolina State Univ. Raleigh., United States)
Griffis, Dieter P.
(North Carolina State Univ. Raleigh., United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1992
Publication Information
Publication: NASA. Langley Research Center, LDEF: 69 Months in Space. First Post-Retrieval Symposium, Part 1
Subject Category
Astrophysics
Accession Number
92N23318
Funding Number(s)
CONTRACT_GRANT: NAG1-1218
CONTRACT_GRANT: NAG1-1214
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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