Post-Flight Characterization of Optical System Samples, Thermal Control Samples, and Detectors from LDEF Experiment M0003, Sub-Experiments 6 and 13

Flight samples and control samples of optical and thermal control coatings have been measured for hemispheric reflectance and transmission. Data was recorded for wavelengths from .25 microns to 18 microns. The samples were exposed directly to the orbital environment, but were on the trailing edge of the LDEF satellite. Preliminary analysis shows no significant change in the reflectance or transmission values of most of the samples.

Post-flight tests of avalanche photodiodes have yielded results. The tests consist of measuring the following detector parameters: breakdown voltage for set values of reverse current, responsivity vs. bias voltage, noise equivalent power, and uniformity of photoresponse. The avalanche photodiodes were mounted on the leading edge of the LDEF satellite, but were shielded from the outside by a silver-coated teflon foil cover. Small puncture holes are present in the foil, probably caused by
impact of particles in orbit. For most of the detectors, there has been no significant change in noise or response.