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Taguchi methods in electronics: A case studyTotal Quality Management (TQM) is becoming more important as a way to improve productivity. One of the technical aspects of TQM is a system called the Taguchi method. This is an optimization method that, with a few precautions, can reduce test effort by an order of magnitude over conventional techniques. The Taguchi method is specifically designed to minimize a product's sensitivity to uncontrollable system disturbances such as aging, temperature, voltage variations, etc., by simultaneously varying both design and disturbance parameters. The analysis produces an optimum set of design parameters. A 3-day class on the Taguchi method was held at the Marshall Space Flight Center (MSFC) in May 1991. A project was needed as a follow-up after the class was over, and the motor controller was selected at that time. Exactly how to proceed was the subject of discussion for some months. It was not clear exactly what to measure, and design kept getting mixed with optimization. There was even some discussion about why the Taguchi method should be used at all.
Document ID
19920019213
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Kissel, R.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
May 1, 1992
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NAS 1.15:103586
NASA-TM-103586
Report Number: NAS 1.15:103586
Report Number: NASA-TM-103586
Accession Number
92N28456
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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