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The Ultra High Resolution XUV Spectroheliograph. II - Predicted performanceThe phenomena to be studied with the Ultra-High Resolution XUV Spectroheliograph (UHRXS) which will be included into the instrumental load of the Space Station Freedom are discussed together with the characteristics of the nine multilayer Ritchey-Chretien telescopes constituting the UHRXS system. The telescopes will cover a spectral range from about 70 A to about 300 A. Each telescope will be able to isolate emission line multiplets excited over a narrow temperature range, providing images of diagnostic quality covering structures in the solar atmosphere ranging from T of about 50,000 K to 30,000,000 K. One of the nine UHRXS telescopes is configured as a coronagraph to allow observations to 6 solar radii beyond the solar limb. The paper presents an analysis of the expected sensitivity and resolving power of the UHRXS telescopes, and the diagnostic response of the various UHRXS instruments to structures in the solar atmosphere between 10,000 K and 100,000,000 K.
Document ID
19920042591
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Walker, Arthur B. C., Jr.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Lindblom, Joakim F.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Timothy, J. G.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Allen, Maxwell J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Deforest, Craig E.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Kankelborg, Charles
(NASA Marshall Space Flight Center Huntsville, AL, United States)
O'Neal, Ray H.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Paris, Elizabeth S.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Willis, Tom
(Stanford University CA, United States)
Barbee, Troy W., Jr.
(Lawrence Livermore National Laboratory Livermore, CA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Spacecraft Instrumentation
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography
Location: San Diego, CA
Country: United States
Start Date: July 9, 1990
End Date: July 13, 1990
Accession Number
92A25215
Distribution Limits
Public
Copyright
Other

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