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Locating Electron Traps In A CCD"Pocket pumping" is technique for mapping sizes of electron-trapping defects and picture elements within which traps located in charge-coupled device (CCD). Two kinds of traps: forward and reverse. Pocket pumping relies on fact that in terms of charges measurable by external circuitry, forward traps affect only forward, while reverse traps affect only reverse, transfer of charge along row or column of picture elements. Charges in picture elements shifted back and forth many times to amplify trapping effect by repetition. Traps smaller than 1 electron detected by this method.
Document ID
19930000546
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Janesick, James
(Caltech)
Date Acquired
August 16, 2013
Publication Date
September 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 9
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-18349
Report Number: NPO-18349
ISSN: 0145-319X
Accession Number
93B10546
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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